Measurement-computing USB-1616FS Manuel d'utilisateur télécharger pdf (Page 22)

Chapter 4

Specifications

All specifications are subject to change without notice.

Typical for 25 °C unless otherwise specified.

Specifications in italic text are guaranteed by design.

Analog input

Table 1. AI specifications

Parameter

Conditions

Specification

A/D converters

16-bit, SAR type

Number of channels

16 single-ended

Input configuration

Individual A/D per channel

Sampling method

Simultaneous

Absolute maximum input

voltage

CHx IN to GND

±15 V max

Input impedance

100 MΩ, min

Input bandwidth (–3 dB)

50 kHz typ

Input leakage current

±1 µA typ

Input capacitance

50 pf typ

Offset temperature drift

15 ppm/°C typ

Gain temperature drift

All ranges

35 ppm/°C typ

Input ranges

Software selectable

±10 V, ±5 V, ±2 V, ±1 V

Sampling rate

Scan to PC memory

0.6 S/s to 50 kS/s, software programmable

Burst scan to 32 k

sample FIFO

20 S/s to 50 kS/s, software programmable

Throughput

Software paced

30 S/s to 500 S/s all channels; throughput is system

dependant)

Scan to PC memory

Refer to the Single Board Throughput and Multiple Board

Throughput sections that follow this table.

Burst scan to 32 k

sample FIFO

= (200 kS/s) / (# of channels), max of 50 kS/s for any channel

Gain queue

Software configurable. Sixteen elements, one gain element per

channel.

Resolution

16 bits

No missing codes

15 bits

Crosstalk

DC – 25 kHz (sine)

–80 dB min

Calibration voltages

0 V, ±0.625 V, ±1.25 V, ±2.5 V, ±5.0 V, software selectable

Calibration voltage

accuracy (Note 1)

±0.5% typ, ±1.0% max

Temperature sensor range

0 °C to +70 °C max

Temperature sensor

accuracy

±3 °C typ

Trigger source

Software selectable

External digital: TRIG_IN

Note 1: Actual values used for calibration are measured and stored in EEPROM.

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